17th IMEKO World Congress on Metrology in the 3rd Millenium, pp. 746-749, IMEKO TC-4, Dubrovnik (Croatia). 22-27 Junio 2003
Summary:
No disponible/Not available
Keywords: No disponible/Not available
Publication date: June 2003.
Citation:
Carpentieri, M., Silveira, J., Giannetti, R., A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization, 17th IMEKO World Congress on Metrology in the 3rd Millenium, pp. 746-749, IMEKO TC-4, Dubrovnik (Croatia). 22-27 June 2003.
IIT-03-105A
