11th/6th Symposium on Trends in Electrical Measurements and Instrumentation and Workshop on ADC Modelling and Testing - IMEKO TC4 -TEMI 2001, Lisboa (Portugal). 13-14 septiembre 2001
Resumen:
Monitoring the intensity of the reflected spot in a RHEED image is the most important method used to control the growth of semiconductor crystals in facilities like for example MBE. In some application the availability of the spot intensity signal as an analog voltage is also useful to realize a feedback between the growth dynamics and the external parameters of the plant, such as the cells temperatures and the syn-chronization of the shutters. Although said analog signal could be obtained by using a photo-detector near the RHEED screen or grabbing and digitizing the RHEED image, these methods are troublesome or expensive respectively. In this paper a simple and cheap solution, based on a synchronized sample and hold operation on the composite video signal, is proposed.
Palabras clave: No disponible/Not available
Publicado en IMEKO TC4 -TEMI 2001, pp: 356-358, ISBN: 978-1-5108-0397-8
Fecha de publicación: 2015-08-01.
Cita:
R. Giannetti, Rheed signal sampling device, 11th/6th Symposium on Trends in Electrical Measurements and Instrumentation and Workshop on ADC Modelling and Testing - IMEKO TC4 -TEMI 2001, Lisboa (Portugal). 13-14 septiembre 2001. En: IMEKO TC4 -TEMI 2001: Conference proceedings, ISBN: 978-1-5108-0397-8
