17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croacia). 22-27 junio 2003
Resumen:
No disponible/Not available
Palabras clave: No disponible/Not available
Fecha de publicación: 2003-06-22.
Cita:
M. Carpentieri, J. Silveira, R. Giannetti, A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization, 17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croacia). 22-27 junio 2003.
