48th Optical Science and Technology, Spie's Annual Meeting, San Diego (Estados Unidos de América). 04-06 agosto 2003
Resumen:
Form Measurements used to lie somewhere between the macroscopic CMM and the microscopic surface measurement. But there are some specific details that may should be treated differently. And one of this is the effect of the probe on the measurement. In the new standards, this appears already as a morphological filter. But there are still some aspects that may be considered also, for instance, the possibility of deformation in the contact between the probe and workpiece. In this work, there has been developed a mathematical model (experimentally proved) to evaluate this effect during a form measurement in a reference laboratory, while performing the usual measurement procedures for roundness, cylindricity, straightness evaluation, among others. It could be considered either in the uncertainty budget or the measurement itself. This model may be extrapolated to other fields, although it was restricted to form measurements at the beginning, where the conditions differ, for example, on the number of points measured, filters and algorithms, etc. Its implementation in other more sophisticated algorithms developed, will not complicate the theoretical model, but may be helpful when comparing the results obtained from different reference laboratories.
Palabras clave: Contact interaction; Form measurement; Morphological filter; Probe deformation; Uncertainty budget
DOI: 
https://doi.org/10.1117/12.507499
Publicado en Proceedings of SPIE, vol: 5190. Recent Developments in Traceable Dimensional Measurements II, pp: 221-231, ISSN: 0277-786X
Fecha de publicación: 2003-11-20.
Cita:
M.A. Sáenz-Nuño, Contact model of the probe in form measurement, 48th Optical Science and Technology, Spie's Annual Meeting, San Diego (Estados Unidos de América). 04-06 agosto 2003. En: Proceedings of SPIE, vol. 5190. Recent Developments in Traceable Dimensional Measurements II, ISSN: 0277-786X
