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Conference paper information

ESD robustness tests on MOSFET power transistors

C. Oliver, O. Martínez, J.M. Miranda

13th Asia-Pacific International Symposium on Electromagnetic Compatibility - APEMC 2022, Beijing (China). 01-04 September 2022


Summary:

All electronic devices must pass certifications to guarantee their robustness against electrostatic discharges (ESD), but the reality is that this is not always specified in the datasheet. In this work we intend to show the importance of verifying the real sensitivity of the devices to be able to work with them safely.


Publication date: 2022-09-01.



Citation:
C. Oliver, O. Martínez, J.M. Miranda, ESD robustness tests on MOSFET power transistors, 13th Asia-Pacific International Symposium on Electromagnetic Compatibility - APEMC 2022, Beijing (China). 01-04 September 2022.

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